SECONDARY ION MASS SPECTROMETRY Scope of the Annual Workshop on Secondary Ion Mass Spectrometry (SIMS)The annual SIMS workshop is a yearly scientific meeting designed to provide an informal forum for the interchange of practical information about secondary ion mass spectrometry. Typically, one or two themes are chosen for a given year, such as time-of-flight SIMS or semiconductor applications. However, the organizing committee strives to have a balance of topic areas each year to appeal to the broad range of interests within our community. The main goal is to provide as informal an atmosphere as possible for the members of our community to meet, exchange new ideas, and renew personal and professional relationships. Events, such as the extended poster sessions, are an essential part of the Workshop. In addition, it is the firm belief of the organizing committee that our future lies in the education of future members our community. Each year we provide as much support, in the form of reduced registrations fees, travel support, and awards as possible to full-time students.History of the Annual Workshop on SIMSUntil the start of the Annual SIMS Workshops, there was no regular forum for the U.S. SIMS community, other than the International Conference on SIMS. While the international conference is the premier international forum for SIMS, the meetings are held biannually and only visit the United States every 6-8 years. When the meeting is at an international venue it is often difficult for many members of the US SIMS community to travel. Recognizing these limitations, the founders of the SIMS workshop (Richard Lareau, Greg Gillen, and Steve Hues) wanted to provide a venue for an informal gathering of the local SIMS community for discussions relating to the fundamental aspects, instrumentation and applications of SIMS and organized the first East Coast SIMS Workshop which was held at the U.S. Army Research Lab in Fort Monmouth, NJ in 1988. Based on the interest generated by first meeting, the meeting has since been held each year. Attendance as increased from ~40 the first year to approximately 160 for the most recent meeting.
For more information about the SIMS Workshop, please contact:
Richard Lareau Scientific/Technical Program Co-Chair Transportation Security Laboratory/DHS Phone: 609-813-2760 Fax: 609-383-1973 Email: Richard.Lareau@DHS.gov Discontinuing the Annual Workshop on SIMS in 2017https://web.archive.org/web/20181101185919/http://annualworkshoponsims.wildapricot.org/ |